Hole & Gap Measurement
Measuring in the smallest of spaces: at the limit of metrology
fionec has developed miniaturized probes based on optical fibers. With diameters starting from just 50 µm, they can enter even the smallest of cavities. This makes it possible to perform inspections of difficult-to-access surfaces that are inaccessible with other probes. Examples include the inner surfaces of micro-drilled holes, narrow gaps or complex free-form surfaces. The optical inspection technique offers a fast, contactless and wear-free way of measuring micro-structures and distances. Including at production speed, if required.
FDM-1 & FDM-2The high-accuracy measuring technology of FDM-1 and FDM-2 allow for a great deal of design flexibility. The technology can be easily integrated into coordinate-measuring machines or existing production lines. RMP – Roughness Measuring DeviceOur roughness measuring station RMP is optimized for performing high-accuracy roughness and surface measurements of precision turned parts. The measuring probe can be introduced laterally or vertically. |
The advantages
Maximum accuracy
The sensor uses the interference principle to deliver absolute values with nanometer precision. The measured value is not lost, even in the event that a measuring process is interrupted, e.g. due to shading of the measuring beam or surface defects. The typical standard deviation is in the low nanometer range. All results are reproducible.
Absolutely contactless
Contactless inspection techniques, such as white light interferometry, are ideal for performing high-precision measurements of microstructures. In contrast with tactile measuring devices, fiber-optic sensors from fionec do not affect or damage the surface of the test specimens. This makes it possible to perform roughness measurements even on delicate objects, such as lenses, wafers and optical flats.
Short inspection cycles
With a measuring frequency of up to 20 kHz, the FDM Series fiber-optic measuring systems work significantly faster than comparable tactile devices. This means that measurements can be performed in shorter cycles or with higher measuring point densities. Non-productive times are significantly reduced.
Fully integrable
The measuring systems can be easily integrated into existing processes via hardware and software interfaces. Manufacturing and inspection processes are brought closer together, and the rapid feedback of test results into the production operation assist in continuously optimizing processes.